The FEI Scios 2 SEM-FIB Dual Beam (EDX/EBSD/Aztec) combines a field emission gun (FEG) electron microscope with a focused ion beam (FIB) system to deliver high-resolution, highly-precise nanoscale material analysis and manipulation.
*NOTE: Users of the BNC may be required to complete onsite and/or on-demand training in order to reserve this instrument. Requirements will be shared by the lab prior to your appointment. Please reach out to us through Second Lab messages and we'll be happy to help you plan for your first booking.